NewsICT Conference 2020

ICT Conference 2020

ICT Conference 2020


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22-25 July 2020 

Industrial X-ray computed tomography is a method whose relevance has increased more and more because of its great advantages. CT is a non-destrusctive methode for measuring components 3-dimensionally in order to find hidden features (e.g. shrink-holes, cracks, inclusions, pores, etc.) in the depth of the material and determine physical variables like porosity and density.

Within this conference the current state-of-the art and new developments in the following areas will be published:

  • CT fot non-dectructive testing of metals, plastics, composites, ceramics and other materials
  • Application of CT in automative-, aerospace- and material industry 
  • CT as a tool for the development of new materials and components
  • CT for 3D material characterisation 
  • Evaluation and visualisation of CT data
  • Correction and filter methods or the improvement of CT resukts
  • Standardisation of CT
  • New developments in CT instrument technology including X-ray detectors and sources
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